| Title | IEEE Design and Test |
| Standard Abbreviation | IEEE Des. Test |
| Type of Publication | Journal |
| Discipline | Electrical and Electronic Engineering (Q2); Hardware and Architecture (Q2); Software (Q2) |
| Impact Score | 1.63 |
| SCImago Journal Rank (SJR) | 0.573 |
| h-index | 82 |
| Overall Rank | 9025 |
| Publisher Name | IEEE Computer Society |
| Publication Country | United States |
| International Standard Serial Number (ISSN) | 21682356 |
| Coverage and History | 2013-2022 |
| Best Quartile | Q2 |
| Total Citations Received (Last 3 Year) |
432 |
IEEE Design and Test is a journal published by IEEE Computer Society. This journal covers the area[s] related to Electrical and Electronic Engineering, Hardware and Architecture, Software, etc.
The coverage history of this journal is as follows: 2013-2022.
The rank of this journal is 9025. This journal's impact score, h-index, and SJR are 1.63, 82, and 0.573, respectively. The ISSN of this journal is/are as follows: 21682356.
The best quartile of IEEE Design and Test is Q2.
This journal has received a total of 432 citations during the last three years (Preceding 2022).
The latest impact score (IS) of the IEEE Design and Test is 1.63. It is computed in the year 2023 as per its definition and based on Scopus data.
1.63
It is decreased by a factor of around 0.22, and the percentage change is -11.89% compared to the preceding year 2021, indicating a falling trend.
The impact score (IS), also denoted as the Journal impact score (JIS), of an academic journal is a measure of the yearly average number of citations to recent articles published in that journal. It is based on Scopus data.
Impact Score 2022 of IEEE Design and Test is 1.63. If a similar downward trend continues, IS may decrease in 2023 as well.
| Year | Impact Score (IS) |
|---|---|
| 2023/2024 | Coming Soon |
| 2022 | 1.63 |
| 2021 | 1.85 |
| 2020 | 1.28 |
| 2019 | 2.04 |
| 2018 | 2.28 |
| 2017 | 1.70 |
| 2016 | 1.35 |
| 2015 | 1.16 |
| 2014 | 1.04 |
The h-index of IEEE Design and Test is 82. By definition of the h-index, this journal has at least 82 published articles with more than 82 citations.
The h-index (also known as the Hirsch index or Hirsh index) is a scientometric parameter used to evaluate the scientific impact of the publications and journals. It is defined as the maximum value of h such that the given Journal has published at least h papers and each has at least h citations.
The International Standard Serial Number (ISSN) of IEEE Design and Test is/are as follows: 21682356.
The ISSN is a unique 8-digit identifier for a specific publication like Magazine or Journal. The ISSN is used in the postal system and in the publishing world to identify the articles that are published in journals, magazines, newsletters, etc. This is the number assigned to your article by the publisher, and it is the one you will use to reference your article within the library catalogues.
ISSN code (also called as "ISSN structure" or "ISSN syntax") can be expressed as follows: NNNN-NNNC
Here, N is in the set {0,1,2,3...,9}, a digit character, and C is in {0,1,2,3,...,9,X}
The IEEE Design and Test is ranked 9025 among 27955 Journals, Conferences, and Book Series.
As per SJR, this journal is ranked 0.573.
SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come.
The publisher of IEEE Design and Test is IEEE Computer Society. The publishing house of this journal is located in the United States. Its coverage history is as follows: 2013-2022.
Please check the official website of this journal to find out the complete details and Call For Papers (CFPs).
The International Organization for Standardization 4 (ISO 4) abbreviation of IEEE Design and Test is IEEE Des. Test. ISO 4 is an international standard which defines a uniform and consistent system for the abbreviation of serial publication titles, which are published regularly. The primary use of ISO 4 is to abbreviate or shorten the names of scientific journals using the technique of List of Title Word Abbreviations (LTWA).
As ISO 4 is an international standard, the abbreviation ('IEEE Des. Test') can be used for citing, indexing, abstraction, and referencing purposes.
If your area of research or discipline is related to Electrical and Electronic Engineering, Hardware and Architecture, Software, etc., please check the journal's official website to understand the complete publication process.
There are several factors that influence the acceptance rate of any academic journal. Here are some critical parameters that are considered while calculating the acceptance rate:
The simplest way to find out the acceptance rate or rejection rate of a Journal/Conference is to check with the journal's/conference's editorial team through emails or through the official website.
The latest impact score of IEEE Design and Test is 1.63. It is computed in the year 2023.
The latest h-index of IEEE Design and Test is 82. It is evaluated in the year 2023.
The latest SCImago Journal Rank (SJR) of IEEE Design and Test is 0.573. It is calculated in the year 2023.
The latest ranking of IEEE Design and Test is 9025. This ranking is among 27955 Journals, Conferences, and Book Series. It is computed in the year 2023.
IEEE Design and Test is published by IEEE Computer Society. The publication country of this journal is United States.
This standard abbreviation of IEEE Design and Test is IEEE Des. Test.
IEEE Design and Test is a journal published by IEEE Computer Society.
The scope of IEEE Design and Test is as follows:
For detailed scope of IEEE Design and Test, check the official website of this journal.
The International Standard Serial Number (ISSN) of IEEE Design and Test is/are as follows: 21682356.
The best quartile for IEEE Design and Test is Q2.
The coverage history of IEEE Design and Test is as follows 2013-2022.
Note: The impact score shown here is equivalent to the average number of times documents published in a journal/conference in the past two years have been cited in the current year (i.e., Cites / Doc. (2 years)). It is based on Scopus data and can be a little higher or different compared to the impact factor (IF) produced by Journal Citation Report. Please refer to the Web of Science data source to check the exact journal impact factor ™ (Thomson Reuters) metric.
| Journal/Conference/Book Title | Type | Publisher | Ranking | SJR | h-index | Impact Score |
|---|---|---|---|---|---|---|
| Zeitschrift fur Germanistische Linguistik | Journal | De Gruyter Mouton | 22945 | 15 | 0.19 | |
| Historia | Journal | Universidade Estadual Paulista | 27560 | 7 | 0.02 | |
| Proceedings of the ASME Turbo Expo | Conference And Proceedings | 17577 | 54 | 0.00 | ||
| Istanbul University - Journal of Electrical and Electronics Engineering | Journal | University of Istanbul | 24654 | 0 | 0.00 | |
| Archives of Phytopathology and Plant Protection | Journal | Taylor and Francis Ltd. | 14852 | 29 | 1.14 | |
| Materials Research | Journal | Universidade Federal de Sao Carlos | 14791 | 65 | 1.62 | |
| Journal of Education and Work | Journal | Brill Academic Publishers | 9268 | 43 | 1.93 | |
| Socialism and Democracy | Journal | Taylor and Francis Ltd. | 26162 | 17 | 0.09 | |
| Proceedings of the International Semiconductor Conference, CAS | Conference And Proceedings | Institute of Electrical and Electronics Engineers Inc. | 25734 | 16 | 0.00 | |
| Archives of the Balkan Medical Union | Journal | Balkan medical union | 23243 | 10 | 0.24 |
| Year | Impact Score (IS) |
|---|---|
| 2023/2024 | Updated Soon |
| 2022 | 1.63 |
| 2021 | 1.85 |
| 2020 | 1.28 |
| 2019 | 2.04 |
| 2018 | 2.28 |
| 2017 | 1.70 |
| 2016 | 1.35 |
| 2015 | 1.16 |
| 2014 | 1.04 |
1.63
0.573
82
9025
