Conference Record - IEEE Instrumentation and Measurement Technology Conference- Impact Score, Ranking, SJR, h-index, Citescore, Rating, Publisher, ISSN, and Other Important Details

About Conference Record - IEEE Instrumentation and Measurement Technology Conference

Conference Record - IEEE Instrumentation and Measurement Technology Conference is a conference and proceedings published by Institute of Electrical and Electronics Engineers Inc.. This conference and proceedings covers the area[s] related to Electrical and Electronic Enginee, Instrumenta, etc. The coverage history of this conference and proceedings is as follows: 1991, 1993-2008, 2011, 2013-2016, 2019, 2021-2022. The rank of this conference and proceedings is 17817. This conference and proceedings's impact score, h-index, and SJR are 0.87, 41, and 0.227, respectively. The ISSN of this conference and proceedings is/are as follows: 10915281.

The best quartile of Conference Record - IEEE Instrumentation and Measurement Technology Conference is -. This conference and proceedings has received a total of 266 citations during the last three years (Preceding 2022).

Conference Record - IEEE Instrumentation and Measurement Technology Conference Impact Score 2022-2023

The latest impact score (IS) of the Conference Record - IEEE Instrumentation and Measurement Technology Conference is 0.87. It is computed in the year 2023 as per its definition and based on Scopus data.

The impact score (IS), also denoted as the Journal impact score (JIS), of an academic journal is a measure of the yearly average number of citations to recent articles published in that journal. It is based on Scopus data.

Conference Record - IEEE Instrumentation and Measurement Technology Conference h-index

 

The h-index of Conference Record - IEEE Instrumentation and Measurement Technology Conference is 41. By definition of the h-index, this conference and proceedings has at least 41 published articles with more than 41 citations.

What is h-index?

The h-index (also known as the Hirsch index or Hirsh index) is a scientometric parameter used to evaluate the scientific impact of the publications and journals. It is defined as the maximum value of h such that the given Journal has published at least h papers and each has at least h citations.

Conference Record - IEEE Instrumentation and Measurement Technology Conference ISSN

The International Standard Serial Number (ISSN) of Conference Record - IEEE Instrumentation and Measurement Technology Conference is/are as follows: 10915281.

The ISSN is a unique 8-digit identifier for a specific publication like Magazine or Journal. The ISSN is used in the postal system and in the publishing world to identify the articles that are published in journals, magazines, newsletters, etc. This is the number assigned to your article by the publisher, and it is the one you will use to reference your article within the library catalogues.

ISSN code (also called as "ISSN structure" or "ISSN syntax") can be expressed as follows: NNNN-NNNC
Here, N is in the set {0,1,2,3...,9}, a digit character, and C is in {0,1,2,3,...,9,X}

Conference Record - IEEE Instrumentation and Measurement Technology Conference Ranking and SCImago Journal Rank (SJR)

The Conference Record - IEEE Instrumentation and Measurement Technology Conference is ranked 17817 among 27955 Journals, Conferences, and Book Series. As per SJR, this conference and proceedings is ranked 0.227.

SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come.

Conference Record - IEEE Instrumentation and Measurement Technology Conference Publisher

The publisher of Conference Record - IEEE Instrumentation and Measurement Technology Conference is Institute of Electrical and Electronics Engineers Inc.. The publishing house of this conference and proceedings is located in the United States. Its coverage history is as follows: 1991, 1993-2008, 2011, 2013-2016, 2019, 2021-2022.

Call For Papers (CFPs)

Please check the official website of this conference and proceedings to find out the complete details and Call For Papers (CFPs).

How to publish in Conference Record - IEEE Instrumentation and Measurement Technology Conference

If your area of research or discipline is related to Electrical and Electronic Enginee, Instrumenta, etc., please check the conference and proceedings's official website to understand the complete publication process.

Acceptance Rate

There are several factors that influence the acceptance rate of any academic journal. Here are some critical parameters that are considered while calculating the acceptance rate:

• Interest/demand of researchers/scientists for publishing in a specific journal/conference.
• The complexity of the peer review process and timeline.
• Time taken from draft submission to final publication.
• Number of submissions received and acceptance slots
• And Many More.

The simplest way to find out the acceptance rate or rejection rate of a Journal/Conference is to check with the journal's/conference's editorial team through emails or through the official website.

Credits and Sources

• Scimago Journal & Country Rank (SJR), https://www.scimagojr.com/
• Journal Impact Factor, https://clarivate.com/
• Issn.org, https://www.issn.org/
• Scopus, https://www.scopus.com/